HB1946 - Relating to the denial of certain applications for a permit or other authorization under the Texas Clean Air Act on the basis of proximity to a semiconductor wafer manufacturing facility.

  89R4891 JRR-D     By: Luther H.B. No. 1946       A BILL TO BE ENTITLED   AN ACT   relating to the denial of certain applications for a permit or other   authorization under the Texas Clean Air Act on the basis of   proximity to a semiconductor wafer manufacturing facility.          BE IT ENACTED BY THE LEGISLATURE OF THE STATE OF TEXAS:          SECTION 1.  Subchapter C, Chapter 382, Health and Safety   Code, is amended by adding Section 382.0595 to read as follows:           Sec.   382.0595.     DENIAL OF CERTAIN APPLICATIONS FOR PERMIT OR   OTHER AUTHORIZATION ON BASIS OF PROXIMITY TO SEMICONDUCTOR WAFER   MANUFACTURING FACILITY. (a) In this section, "semiconductor wafer   manufacturing facility" means a manufacturing facility that   includes any of the following processes with respect to   semiconductor production:                 (1)  growing single-crystal ingots or boules;                 (2)  wafer slicing;                 (3)  etching and polishing;                 (4)  bonding;                 (5)  cleaning;                 (6)  epitaxial deposition; or                 (7)  metrology.           (b)     Notwithstanding any other law, the commission shall   deny an application for a permit or other authorization under this   chapter that is subject to new source review if the permit or other   authorization is for a permanent cement production plant, including   a cement kiln, that will be located within 10 miles of a   semiconductor wafer manufacturing facility.          SECTION 2.  This Act takes effect September 1, 2025.